Invention Grant
- Patent Title: X-ray scattering apparatus
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Application No.: US16301980Application Date: 2017-05-17
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Publication No.: US11029265B2Publication Date: 2021-06-08
- Inventor: Peter Hoghoj
- Applicant: XENOCS SAS
- Applicant Address: FR Grenoble
- Assignee: XENOCS SAS
- Current Assignee: XENOCS SAS
- Current Assignee Address: FR Grenoble
- Agency: Notaro, Michalos & Zaccaria P.C.
- Priority: EP16290087 20160520
- International Application: PCT/EP2017/061894 WO 20170517
- International Announcement: WO2017/198736 WO 20171123
- Main IPC: G01N23/201
- IPC: G01N23/201 ; G01N23/20 ; G01N23/20008

Abstract:
An X-ray scattering apparatus has a sample holder for aligning and orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction towards the sample holder, a proximal X-ray detector arranged downstream of the sample holder as to let the direct X-ray beam pass and detect X rays scattered from the sample, and a distal X-ray detector arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam in which the proximal X-ray detector is also movable essentially along the propagation direction of the direct X-ray beam.
Public/Granted literature
- US20190170669A1 X-RAY SCATTERING APPARATUS Public/Granted day:2019-06-06
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