公开(公告)号：US11835474B2

公开(公告)日：2023-12-05

申请号：US17783183

申请日：2020-12-29

Applicant: XENOCS SAS

Inventor： Karsten Joensen ,  Peter Hoghoj ,  Ronan Mahe

IPC: G01N23/201 ,  G01N23/041 ,  G01N23/207

CPC classification number: G01N23/041 ,  G01N23/201 ,  G01N23/207 ,  G01N2223/054 ,  G21K2201/067

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.

公开(公告)号：US11275038B2

公开(公告)日：2022-03-15

申请号：US17054457

申请日：2019-05-15

Applicant: XENOCS SAS

Inventor： Peter Hoghoj ,  Blandine Lantz ,  Karsten Joensen ,  Soren Skou

IPC: G01N23/201 ,  G01N23/207

Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.

公开(公告)号：US11796485B2

公开(公告)日：2023-10-24

申请号：US17621005

申请日：2020-12-29

Applicant: XENOCS SAS

Inventor： Peter Hoghoj ,  Blandine Lantz

IPC: G01N23/201 ,  G01N23/041 ,  G01N23/207

CPC classification number: G01N23/041 ,  G01N23/201 ,  G01N23/207 ,  G01N2223/054 ,  G21K2201/067

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.

公开(公告)号：US20230012833A1

公开(公告)日：2023-01-19

申请号：US17783183

申请日：2020-12-29

Applicant: XENOCS SAS

Inventor： Karsten JOENSEN ,  Peter HOGHOJ ,  Ronan MAHE

IPC: G01N23/041 ,  G01N23/201

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.

公开(公告)号：US20240248050A1

公开(公告)日：2024-07-25

申请号：US18562508

申请日：2022-05-24

Applicant: XENOCS SAS

Inventor： Peter HOGHOJ ,  Karsten JOENSEN ,  Pierre PANINE

IPC: G01N23/201 ,  G01N23/20008

CPC classification number: G01N23/201 ,  G01N23/20008 ,  G01N2223/33

Abstract: An X-ray scattering apparatus has a sample vacuum chamber, a sample holder placed inside the sample vacuum chamber for aligning and/or orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system having a 2D X-ray source and a 2D monochromator and being arranged upstream of the sample holder for generating and directing an X-ray beam along a beam path in a propagation direction towards the sample holder. An X-ray detector placed inside a diffraction chamber connected to the sample vacuum chamber where the X-ray detector is arranged downstream of the sample holder and is movable, in a motorized way, along the propagation direction so as to detect the X-ray beam and X-rays scattered at different scattering angles, where the X-ray beam delivery system is configured to focus the X-ray beam onto a focal spot on or near the X-ray detector when placed at its distal position.

公开(公告)号：US20220326166A1

公开(公告)日：2022-10-13

申请号：US17621005

申请日：2020-12-29

Applicant: XENOCS SAS

Inventor： Peter HOGHOJ ,  Blandine LANTZ

IPC: G01N23/041 ,  G01N23/201

Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.

公开(公告)号：US20210364454A1

公开(公告)日：2021-11-25

申请号：US17054457

申请日：2019-05-15

Applicant: XENOCS SAS

Inventor： Peter HOGHOJ ,  Blandine LANTZ ,  Karsten JOENSEN ,  Soren SKOU

IPC: G01N23/201 ,  G01N23/207

Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.

公开(公告)号：US11029265B2

公开(公告)日：2021-06-08

申请号：US16301980

申请日：2017-05-17

Applicant: XENOCS SAS

Inventor： Peter Hoghoj

IPC: G01N23/201 ,  G01N23/20 ,  G01N23/20008

Abstract: An X-ray scattering apparatus has a sample holder for aligning and orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction towards the sample holder, a proximal X-ray detector arranged downstream of the sample holder as to let the direct X-ray beam pass and detect X rays scattered from the sample, and a distal X-ray detector arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam in which the proximal X-ray detector is also movable essentially along the propagation direction of the direct X-ray beam.