Invention Grant
- Patent Title: Observation method, specimen support, and transmission electron microscope
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Application No.: US16410243Application Date: 2019-05-13
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Publication No.: US11037755B2Publication Date: 2021-06-15
- Inventor: Yuji Konyuba , Yuta Ikeda , Tomohiro Haruta , Tomohisa Fukuda
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JPJP2018-092852 20180514
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/28 ; H01J37/244

Abstract:
An observation method includes placing a specimen on a specimen supporting film of a specimen support, attaching the specimen support to a retainer, attaching the retainer to an optical microscope retainer holding base, attaching the optical microscope retainer holding base to a specimen stage of an optical microscope and observing the specimen under the optical microscope, attaching the retainer to a transmission electron microscope retainer holding base, and loading the transmission electron microscope retainer holding base into a transmission electron microscope and observing the specimen under the transmission electron microscope.
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