Invention Grant
- Patent Title: Charged particle beam source and a method for assembling a charged particle beam source
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Application No.: US17110167Application Date: 2020-12-02
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Publication No.: US11189451B2Publication Date: 2021-11-30
- Inventor: Itay Asulin , Ofer Yuli , Lavy Shavit , Yoram Uziel , Guy Eytan , Natan Schlimoff , Igor Krivts (Krayvitz) , Jacob Levin , Israel Avneri
- Applicant: APPLIED MATERIALS ISRAEL LTD.
- Applicant Address: IL Rehovot
- Assignee: APPLIED MATERIALS ISRAEL LTD.
- Current Assignee: APPLIED MATERIALS ISRAEL LTD.
- Current Assignee Address: IL Rehovot
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H01J1/92
- IPC: H01J1/92 ; H01J1/304 ; H01J9/02 ; H01J9/18

Abstract:
A charged particle beam source that may include an emitter that has a tip for emitting charged particles; a socket; electrodes; a filament that is connected to the electrodes and to the emitter; electrodes for providing electrical signals to the filament; a support element that is connected to the emitter; and a support structure that comprises one or more interfaces for contacting only a part of the support element while supporting the support element.
Public/Granted literature
- US20210175040A1 CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED PARTICLE BEAM SOURCE Public/Granted day:2021-06-10
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