Invention Grant
- Patent Title: Methods for forming structures with desired crystallinity for MRAM applications
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Application No.: US15199006Application Date: 2016-06-30
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Publication No.: US11245069B2Publication Date: 2022-02-08
- Inventor: Lin Xue , Jaesoo Ahn , Mahendra Pakala , Chi Hong Ching , Rongjun Wang
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: H01L43/12
- IPC: H01L43/12 ; H01L43/08 ; H01L43/10 ; H01F10/14 ; H01F10/32

Abstract:
Embodiments of the disclosure provide methods and apparatus for fabricating magnetic tunnel junction (MTJ) structures on a substrate in for spin-transfer-torque magnetoresistive random access memory (STT-MRAM) applications. In one embodiment, the method includes patterning a film stack having a tunneling barrier layer disposed between a magnetic reference layer and a magnetic storage layer disposed on a substrate to remove a portion of the film stack from the substrate until an upper surface of the substrate is exposed, forming a sidewall passivation layer on sidewalls of the patterned film stack and subsequently performing a thermal annealing process to the film stack.
Public/Granted literature
- US20170018706A1 METHODS FOR FORMING STRUCTURES WITH DESIRED CRYSTALLINITY FOR MRAM APPLICATIONS Public/Granted day:2017-01-19
Information query
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