Invention Grant
- Patent Title: Determining significance levels of error values in processes that include multiple layers
-
Application No.: US16115100Application Date: 2018-08-28
-
Publication No.: US11294763B2Publication Date: 2022-04-05
- Inventor: John Paul Strachan , Catherine Graves , Dejan S. Milojicic , Paolo Faraboschi , Martin Foltin , Sergey Serebryakov
- Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Applicant Address: US TX Houston
- Assignee: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Current Assignee: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Current Assignee Address: US TX Houston
- Agency: Mahamedi Paradice LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/10 ; G11C29/52

Abstract:
A computer system includes multiple memory array components that include respective analog memory arrays which are sequenced to implement a multi-layer process. An error array data structure is obtained for at least a first memory array component, and from which a determination is made as to whether individual nodes (or cells) of the error array data structure are significant. A determination can be made as to any remedial operations that can be performed to mitigate errors of significance.
Public/Granted literature
- US20200073755A1 DETERMINING SIGNIFICANCE LEVELS OF ERROR VALUES IN PROCESSES THAT INCLUDE MULTIPLE LAYERS Public/Granted day:2020-03-05
Information query