Invention Grant
- Patent Title: Spectral measurement method, spectral measurement system, and broadband pulsed light source unit
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Application No.: US16619893Application Date: 2018-06-06
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Publication No.: US11300452B2Publication Date: 2022-04-12
- Inventor: Aya Ota , Toshio Yokota
- Applicant: Ushio Denki Kabushiki Kaisha
- Applicant Address: JP Tokyo
- Assignee: Ushio Denki Kabushiki Kaisha
- Current Assignee: Ushio Denki Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: JPJP2017-113823 20170608
- International Application: PCT/JP2018/021762 WO 20180606
- International Announcement: WO2018/225799 WO 20181213
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01N21/35 ; G01J3/453 ; G01J3/457

Abstract:
A new spectral measurement technique is provided which enables measurement even if the light to be measured exists for a very short period. In one embodiment, a broadband pulsed light wave whose wavelength shifts temporally and continuously in a pulse interferes with a light wave to be measured. The intensity at each wavelength of the light wave to be measured is obtained using a Fourier transform of the output signal from a detector that has detected the intensity of the wave resulting from the interference. A laser beam from a laser source is converted to a supercontinuum wave by a nonlinear optical element, and a pulse extension element extends pulses of the supercontinuum wave, thus generating the broadband pulsed light wave.
Public/Granted literature
- US20200166406A1 SPECTRAL MEASUREMENT METHOD, SPECTRAL MEASUREMENT SYSTEM, AND BROADBAND PULSED LIGHT SOURCE UNIT Public/Granted day:2020-05-28
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