Invention Grant
- Patent Title: Detection scheme for x-ray small angle scattering
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Application No.: US16955939Application Date: 2018-12-20
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Publication No.: US11313814B2Publication Date: 2022-04-26
- Inventor: Ge Wang , Guang Li , Wenxiang Cong
- Applicant: RENSSELAER POLYTECHNIC INSTITUTE
- Applicant Address: US NY Troy
- Assignee: RENSSELAER POLYTECHNIC INSTITUTE
- Current Assignee: RENSSELAER POLYTECHNIC INSTITUTE
- Current Assignee Address: US NY Troy
- Agency: Murtha Cullina LLP
- Agent Anthony P. Gangemi
- International Application: PCT/US2018/066736 WO 20181220
- International Announcement: WO2019/126458 WO 20190627
- Main IPC: G01N23/20008
- IPC: G01N23/20008 ; G01N23/201 ; G01N23/046 ; G21K1/02 ; A61B6/03

Abstract:
A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the grating are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.
Public/Granted literature
- US20210080409A1 DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING Public/Granted day:2021-03-18
Information query
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