Invention Grant
- Patent Title: Charged particle beam apparatus
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Application No.: US16814293Application Date: 2020-03-10
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Publication No.: US11322331B2Publication Date: 2022-05-03
- Inventor: Yuta Murakami , Yoshikazu Nemoto
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JPJP2019-047949 20190315
- Main IPC: H01J37/22
- IPC: H01J37/22 ; H01J37/28

Abstract:
An imaging device images a sample holder held by a sample stage. At a front side (target side) of the imaging device, a light emitter device array and a mask array are provided. A plurality of light beams are generated by the light emitter device array. A plurality of center parts of the plurality of light beams are masked by the mask array. A plurality of shadows produced thereby are covered by a plurality of peripheral parts of the plurality of light beams.
Public/Granted literature
- US20200294761A1 Charged Particle Beam Apparatus Public/Granted day:2020-09-17
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