Invention Grant
- Patent Title: Testkey detection circuit
-
Application No.: US16249812Application Date: 2019-01-16
-
Publication No.: US11348847B2Publication Date: 2022-05-31
- Inventor: Kun-Yuan Wu , Wei-Jen Wang , Chien-Fu Chen , Chen-Hsien Hsu , Yuan-Hui Chen , Ruei-Yau Chen , Cheng-Tsung Ku , Zhi-Hong Huang , Cheng-Yang Tsai , Yu-Lin Chen
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Priority: CN201811524365.9 20181213
- Main IPC: H01L21/66
- IPC: H01L21/66 ; G01R31/28 ; H03K3/03 ; H01L23/544
Abstract:
The invention provides a testkey detection circuit, including a plurality of oscillators and a driving circuit. Each of the oscillators has an enable terminal, a voltage terminal and an output terminal, wherein the enable terminals are connected to a common enable terminal. The driving circuit receives the output terminals of the oscillators and increases a driving level of a selected one of the output terminals as a frequency output.
Information query
IPC分类:
