Invention Grant
- Patent Title: Method for on-orbit calibration of basic parameters of mass spectrometer
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Application No.: US17716090Application Date: 2022-04-08
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Publication No.: US11462395B1Publication Date: 2022-10-04
- Inventor: Ziheng Liu , Jiannan Li , Fei Su , Huaiyu He
- Applicant: Institute of Geology and Geophysics, Chinese Academy of Sciences
- Applicant Address: CN Beijing
- Assignee: Institute of Geology and Geophysics, Chinese Academy of Sciences
- Current Assignee: Institute of Geology and Geophysics, Chinese Academy of Sciences
- Current Assignee Address: CN Beijing
- Agency: Porter Wright Morris & Arthur LLP
- Priority: CN202110766464.3 20210707
- Main IPC: H01J49/04
- IPC: H01J49/04 ; H01J49/00

Abstract:
The present disclosure relates to the technical field of calibration of basic parameters of mass spectrometers, and provides a method for on-orbit calibration of basic parameters of a mass spectrometer. Based on the characteristic that a molten silicate mineral can adsorb a gas in an environment, under vacuum conditions, a silicate mineral is heated to obtain the molten silicate mineral. The molten silicate mineral is put in an environment with a standard gas for adsorption, rapid cooling is conducted to obtain a standard sample, and the standard sample is preloaded into a thermal control device of the mass spectrometer. When the mass spectrometer enters a definitive orbit for testing a substance, on-orbit heating is conducted on the standard sample to make the adsorbed standard gas released into the mass spectrometer so as to achieve the calibration of the basic parameters of the mass spectrometer.
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