Invention Grant
- Patent Title: Measurement device and signal processing method
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Application No.: US17413011Application Date: 2018-12-18
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Publication No.: US11842881B2Publication Date: 2023-12-12
- Inventor: Akio Yamamoto , Kazuki Ikeda , Wen Li , Shunsuke Mizutani , Hiroyuki Takahashi
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge, P.C.
- International Application: PCT/JP2018/046514 2018.12.18
- International Announcement: WO2020/129150A 2020.06.25
- Date entered country: 2021-06-11
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/244

Abstract:
A measurement device that comprises a photoelectric conversion element and a signal processing part that receives, from the photoelectric conversion element, detected pulses that include dark pulses and signal pulses that are outputted in accordance with inputted photons. The signal processing part performs amplitude discrimination on the detected pulses on the basis of a pre-acquired dark pulse amplitude distribution for the photoelectric conversion element.
Public/Granted literature
- US20220068597A1 MEASUREMENT DEVICE AND SIGNAL PROCESSING METHOD Public/Granted day:2022-03-03
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