Invention Grant
- Patent Title: Memory device test mode access
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Application No.: US18103603Application Date: 2023-01-31
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Publication No.: US11854637B2Publication Date: 2023-12-26
- Inventor: Michael R. Spica , David G. Springberg
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/10 ; G06F9/30 ; G06F11/22 ; G11C29/14
Abstract:
A system includes a memory device and a processing device coupled to the memory device. The processing device is configured to switch an operating mode of the memory device between a test mode and a non-test mode. The system further includes a test mode access component that is configured to access the memory device while the memory device is in the test mode to perform a test mode operation.
Public/Granted literature
- US20230178163A1 MEMORY DEVICE TEST MODE ACCESS Public/Granted day:2023-06-08
Information query
