Invention Grant
- Patent Title: Mass spectrometer and mass spectrometry method
-
Application No.: US17601456Application Date: 2019-05-08
-
Publication No.: US11942313B2Publication Date: 2024-03-26
- Inventor: Yusuke Tagawa , Yuki Ishikawa
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2019/018334 2019.05.08
- International Announcement: WO2020/225863A 2020.11.12
- Date entered country: 2021-10-05
- Main IPC: H01J49/00
- IPC: H01J49/00 ; G01N27/623 ; H01J49/04

Abstract:
A mass spectrometer according to an aspect of the present invention includes, to optimize N (where N is an integer of 2 or more) parameters that affect ionization efficiency in an ion source (31), a measurement controller (41) that causes respective units to repeatedly execute measurement on a sample containing a target component while changing values of the N parameters or a value set of M (where M is an integer smaller than N) parameters, in a plurality of stages, and a parameter determiner (53) that sequentially finds an optimum value for each parameter based on a result of the measurement executed under control of the measurement controller (41). At least one parameter whose physical quantity is temperature is optimized prior to all of the parameters whose physical quantities are other than temperature.
Public/Granted literature
- US20220199382A1 MASS SPECTROMETER AND MASS SPECTROMETRY METHOD Public/Granted day:2022-06-23
Information query