- Patent Title: System and method for performing tear film structure measurement
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Application No.: US17473839Application Date: 2021-09-13
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Publication No.: US12023099B2Publication Date: 2024-07-02
- Inventor: Yoel Arieli , Yoel Cohen , Shlomi Epstein , Dror Arbel , Ra'anan Gefen
- Applicant: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Applicant Address: IL Lod
- Assignee: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Current Assignee: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Current Assignee Address: IL Lod
- Agency: Kolisch Hartwell, P.C.
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/00 ; A61B3/15 ; G01B9/02 ; G01B11/06 ; G01J3/02 ; G01J3/45 ; G01J3/453

Abstract:
Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.
Public/Granted literature
- US20220007933A1 SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT Public/Granted day:2022-01-13
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