Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US17771551Application Date: 2020-10-06
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Publication No.: US12142457B2Publication Date: 2024-11-12
- Inventor: Takahiro Nishihata , Mayuka Osaki , Yuji Takagi , Takuma Yamamoto , Makoto Suzuki
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge, P.C.
- Priority: JP2019-199141 20191031
- International Application: PCT/JP2020/037812 WO 20201006
- International Announcement: WO2021/085049 WO 20210506
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/22 ; H01J37/244

Abstract:
A charged particle beam device 1 includes: a plurality of detectors 7 for detecting a signal particle 9 emitted from a sample 8 irradiated with a charged particle beam 3 and converting the detected signal particle 9 into an output electrical signal 17; an energy discriminator 14 provided for each detector 7 and configured to discriminate the output electrical signal 17 according to energy of the signal particle 9; a discrimination control block 21 for setting an energy discrimination condition of each of the energy discriminators 14; and an image calculation block 22 for generating an image based on the discriminated electrical signal. The discrimination control block 21 sets energy discrimination conditions different from each other among the plurality of energy discriminators 14.
Public/Granted literature
- US20220367147A1 CHARGED PARTICLE BEAM DEVICE Public/Granted day:2022-11-17
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