- Patent Title: Analysis system, auxiliary analysis apparatus and analysis method
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Application No.: US17852321Application Date: 2022-06-28
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Publication No.: US12154775B2Publication Date: 2024-11-26
- Inventor: Yu-Teh Chung , Yen-An Tsai , Hung-Jen Chen
- Applicant: Materials Analysis Technology Inc.
- Applicant Address: TW Hsinchu County
- Assignee: Materials Analysis Technology Inc.
- Current Assignee: Materials Analysis Technology Inc.
- Current Assignee Address: TW Hsinchu County
- Agency: Li & Cai Intellectual Property Office
- Priority: TW111112981 20220406
- Main IPC: H01J49/00
- IPC: H01J49/00 ; G01N30/72 ; G01N30/86 ; G01N30/02

Abstract:
An analysis system, an auxiliary analysis apparatus, and an analysis method are provided. The analysis method is used to perform a composition analysis operation on an analyte of a sample, and includes: a first heating step, a first mass spectrometry analysis step, a second heating step, a second mass spectrometry analysis step, and an analysis step. A heating device heats a non-analyzed area and a to-be-analyzed area of the sample in the first and the second heating step, respectively. In the first and the second mass spectrometry analysis step, gas generated after heating of the sample is guided into a gas chromatography-mass spectrometer, and two pieces of analysis data are correspondingly obtained. The analysis step is to compare the two pieces of analysis data and generate analysis result data. The analysis result data contains components of a composition that forms at least one portion of the analyte.
Public/Granted literature
- US20230326730A1 ANALYSIS SYSTEM, AUXILIARY ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2023-10-12
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