Invention Grant
- Patent Title: High pressure mass analyzer
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Application No.: US17792656Application Date: 2021-01-14
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Publication No.: US12230489B2Publication Date: 2025-02-18
- Inventor: James Hager
- Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- Applicant Address: SG Singapore
- Assignee: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- Current Assignee: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- Current Assignee Address: SG Singapore
- Agency: Potomac Law Group, PLLC
- Agent Reza Mollaaghababa; Brian Hairston
- International Application: PCT/IB2021/050262 WO 20210114
- International Announcement: WO2021/144737 WO 20210722
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/06

Abstract:
In one aspect, a mass spectrometer is disclosed, which comprises a Fourier Transform (FT) mass analyzer having an input port for receiving ions and an exit port through which the ions exit the FT mass analyzer, a detector disposed downstream of said FT analyzer for detecting ions exiting the FT analyzer, and a multi-segment ion guide having a plurality of segments, said multi-segment ion guide being disposed upstream of said FT mass analyzer and having an input port for receiving ions and an output port through which ions exit the FT mass analyzer. The segments of the ion guide are configured to be independently activated via application of a DC offset voltage thereto so as to adjust a length through which ions passing through the ion guide experience collisional cooling.
Public/Granted literature
- US20230027201A1 High Pressure Mass Analyzer Public/Granted day:2023-01-26
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