Invention Grant
- Patent Title: STED microscopy method with improved signal to noise ratio in low photon count imaging conditions
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Application No.: US17636035Application Date: 2020-10-08
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Publication No.: US12243194B2Publication Date: 2025-03-04
- Inventor: Luis Alvarez , Frank Hecht
- Applicant: LEICA MICROSYSTEMS CMS GMBH
- Applicant Address: DE Wetzlar
- Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee Address: DE Wetzlar
- Agency: LEYDIG, VOIT & MAYER, LTD.
- Priority: EP19202285 20191009
- International Application: PCT/EP2020/078317 WO 20201008
- International Announcement: WO2021/069611 WO 20210415
- Main IPC: G06T5/70
- IPC: G06T5/70 ; G01N21/64 ; G06T5/10 ; G06T5/20 ; G06T5/50

Abstract:
The present invention relates to a method for generating a result image. The method comprises the steps of: acquiring a STED image of a sample, the STED image comprising pixels; calculating Fourier coefficients of arrival times for the pixels of the image, resulting in real coefficients representing a first image and in imaginary coefficients representing a second image; deriving an intensity image from the STED image; applying a spatial filter to the first image, the second image and the intensity image, resulting in a filtered first image, a filtered second image, and filtered intensity image, respectively; calculating an image G based on the filtered first image and the filtered intensity image; calculating an image S based on the filtered second image and the filtered intensity image; and calculating a result image based on the image G and the image S.
Public/Granted literature
- US20220343467A1 STED MICROSCOPY METHOD WITH IMPROVED SIGNAL TO NOISE RATIO IN LOW PHOTON COUNT IMAGING CONDITIONS Public/Granted day:2022-10-27
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