Invention Application
US20030053048A1 Electron microscope and spectroscopy system 失效
电子显微镜和光谱系统

Electron microscope and spectroscopy system
Abstract:
An electron microscope 10 is adapted to enable spectroscopic analysis of a sample 16. A parabolic mirror 18 has a central aperture 20 through which the electron beam can pass. The mirror 18 focuses laser illumination from a transverse optical path 24 onto the sample, and collects Raman and/or other scattered light, passing it back to an optical system 30. The mirror 18 is retractable (within the vacuum of the electron microscope) by a sliding arm assembly 22.
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