Electron microscope and spectroscopy system
    1.
    发明申请
    Electron microscope and spectroscopy system 失效
    电子显微镜和光谱系统

    公开(公告)号:US20030053048A1

    公开(公告)日:2003-03-20

    申请号:US10211558

    申请日:2002-08-05

    Applicant: RENISHAW PLC

    Abstract: An electron microscope 10 is adapted to enable spectroscopic analysis of a sample 16. A parabolic mirror 18 has a central aperture 20 through which the electron beam can pass. The mirror 18 focuses laser illumination from a transverse optical path 24 onto the sample, and collects Raman and/or other scattered light, passing it back to an optical system 30. The mirror 18 is retractable (within the vacuum of the electron microscope) by a sliding arm assembly 22.

    Abstract translation: 电子显微镜10适于使得能够对样品16进行光谱分析。抛物面反射镜18具有中心孔20,电子束可以穿过中心孔20。 反射镜18将来自横向光路24的激光照明聚焦到样品上,并收集拉曼和/或其他散射光,将其返回到光学系统30.反射镜18可以在电子显微镜的真空中收缩(在电子显微镜的真空中) 滑动臂组件22。

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