Invention Application
- Patent Title: VERTICAL GATE NAND MEMORY DEVICES
- Patent Title (中): 垂直门NAND存储器件
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Application No.: US14314622Application Date: 2014-06-25
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Publication No.: US20150014760A1Publication Date: 2015-01-15
- Inventor: Bruce Lynn Bateman
- Applicant: Unity Semiconductor Corporation
- Main IPC: H01L27/115
- IPC: H01L27/115

Abstract:
In an example, a device comprises a vertical stack of memory cells. Each memory cell of the vertical stack may include more than one memory element. A first vertical gate line may be coupled to a first one of the memory elements in each memory cell, and a second vertical gate line may be coupled to a second one of the memory elements in each memory cell. The first vertical gate line may be electrically isolated from the second vertical gate line.
Public/Granted literature
- US09570459B2 Vertical gate NAND memory devices Public/Granted day:2017-02-14
Information query
IPC分类: