Invention Application
US20150380208A1 CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR INSPECTING OR OBSERVING SAMPLE 审中-公开
充电颗粒光束装置,用于调整充电颗粒光束装置的方法,以及用于检查或观察样品的方法

  • Patent Title: CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR INSPECTING OR OBSERVING SAMPLE
  • Patent Title (中): 充电颗粒光束装置,用于调整充电颗粒光束装置的方法,以及用于检查或观察样品的方法
  • Application No.: US14850085
    Application Date: 2015-09-10
  • Publication No.: US20150380208A1
    Publication Date: 2015-12-31
  • Inventor: Yusuke OMINAMITomohisa OHTAKISukehiro ITO
  • Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
  • Priority: JP2011-205499 20110921
  • Main IPC: H01J37/18
  • IPC: H01J37/18 H01J37/244 H01J37/28
CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR INSPECTING OR OBSERVING SAMPLE
Abstract:
A charged particle beam device capable of observing a sample in an air atmosphere or gas atmosphere has a thin film for separating the atmospheric pressure space from the decompressed space. A vacuum evacuation pump evacuates a first housing; and a detector detects a charged particle beam (obtained by irradiation of the sample) in the first housing. A thin film is provided to separate the inside of the first housing and the inside of a second housing at least along part of the interface between the first and second housings. An opening part is formed in the thin film so that its opening area on a charged particle irradiation unit's side is larger than its opening area on the sample side; and the thin film which covers the sample side of the opening part transmits or allows through the primary charged particle beam and the charged particle beam.
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