Invention Application
- Patent Title: Charged Particle Beam Apparatus and Sample Image Acquiring Method
- Patent Title (中): 带电粒子束装置和样本图像采集方法
-
Application No.: US14912521Application Date: 2014-03-10
-
Publication No.: US20160203944A1Publication Date: 2016-07-14
- Inventor: Yusuke OMINAMI , Masako NISHIMURA , Shinsuke KAWANISHI , Hiroyuki SUZUKI
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Priority: JP2013-184600 20130906
- International Application: PCT/JP2014/056094 WO 20140310
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/26 ; H01J37/18

Abstract:
Disclosed is a charged particle beam apparatus wherein a partitioning film capable of transmitting a charged particle beam is provided between a charged particle optical system and a sample, said charged particle beam apparatus eliminating a contact between the sample and the partitioning film even in the cases where the sample has recesses and protrusions. On the basis of detection signals or an image generated on the basis of the detection signals, a distance between a sample and a partitioning film is monitored, said detection signals being outputted from a detector that detects secondary charged particles discharged from the sample due to irradiation of a primary charged particle beam.
Public/Granted literature
- US09741526B2 Charged particle beam apparatus and sample image acquiring method Public/Granted day:2017-08-22
Information query