Invention Application
- Patent Title: DETECTOR FOR IDENTIFYING AT LEAST ONE MATERIAL PROPERTY
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Application No.: US17439492Application Date: 2020-03-13
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Publication No.: US20220157044A1Publication Date: 2022-05-19
- Inventor: Friedrich Schick , Peter Schillen , Patrick Schindler , Andre Schmidt , Michael Eberspach , Christian Lennartz , Robert Send , Lars Diesselberg , Heiko Hengen , Ingmar Bruder , Jakob Unger , Christian Bonsignore
- Applicant: trinamiX GmbH
- Applicant Address: DE Ludwigshafen am Rhein
- Assignee: trinamiX GmbH
- Current Assignee: trinamiX GmbH
- Current Assignee Address: DE Ludwigshafen am Rhein
- Priority: EP19163250.4 20190315
- International Application: PCT/EP2020/056759 WO 20200313
- Main IPC: G06V10/764
- IPC: G06V10/764 ; G01B11/22 ; G01C21/16 ; G01S17/66 ; G06T7/73 ; G06T5/20 ; G06T5/00 ; H04N5/225 ; H04N5/235 ; G06T7/20 ; G06T7/521

Abstract:
Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.
Public/Granted literature
- US11947013B2 Detector for identifying at least one material property Public/Granted day:2024-04-02
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