公开(公告)号：US20220157044A1

公开(公告)日：2022-05-19

申请号：US17439492

申请日：2020-03-13

Applicant: trinamiX GmbH

Inventor： Friedrich Schick ,  Peter Schillen ,  Patrick Schindler ,  Andre Schmidt ,  Michael Eberspach ,  Christian Lennartz ,  Robert Send ,  Lars Diesselberg ,  Heiko Hengen ,  Ingmar Bruder ,  Jakob Unger ,  Christian Bonsignore

IPC: G06V10/764 ,  G01B11/22 ,  G01C21/16 ,  G01S17/66 ,  G06T7/73 ,  G06T5/20 ,  G06T5/00 ,  H04N5/225 ,  H04N5/235 ,  G06T7/20 ,  G06T7/521

Abstract: Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

公开(公告)号：US12298394B2

公开(公告)日：2025-05-13

申请号：US18425144

申请日：2024-01-29

Applicant: trinamix GmbH

Inventor： Friedrich Schick ,  Peter Schillen ,  Patrick Schindler ,  Andre Schmidt ,  Michael Eberspach ,  Christian Lennartz ,  Robert Send ,  Lars Diesselberg ,  Heiko Hengen ,  Ingmar Bruder ,  Jakob Unger ,  Christian Bonsignore

IPC: G01S17/46 ,  G01B11/22 ,  G01C21/16 ,  G01S17/66 ,  G06T5/20 ,  G06T5/70 ,  G06T7/20 ,  G06T7/521 ,  G06T7/73 ,  G06V10/145 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/74

Abstract: Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

公开(公告)号：US11947013B2

公开(公告)日：2024-04-02

申请号：US17439492

申请日：2020-03-13

Applicant: trinamiX GmbH

Inventor： Friedrich Schick ,  Peter Schillen ,  Patrick Schindler ,  Andre Schmidt ,  Michael Eberspach ,  Christian Lennartz ,  Robert Send ,  Lars Diesselberg ,  Heiko Hengen ,  Ingmar Bruder ,  Jakob Unger ,  Christian Bonsignore

IPC: G06T7/521 ,  G01B11/22 ,  G01C21/16 ,  G01S17/46 ,  G01S17/66 ,  G06T5/00 ,  G06T5/20 ,  G06T7/20 ,  G06T7/73 ,  G06V10/145 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/74

CPC classification number: G01S17/46 ,  G01B11/22 ,  G01C21/16 ,  G01S17/66 ,  G06T5/002 ,  G06T5/20 ,  G06T7/20 ,  G06T7/521 ,  G06T7/73 ,  G06V10/145 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/74

Abstract: Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.