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    DEPTH MEASUREMENT THROUGH DISPLAY
    2.
    发明申请
    DEPTH MEASUREMENT THROUGH DISPLAY 有权

    公开(公告)号：US20220398759A1

    公开(公告)日：2022-12-15

    申请号：US17756552

    申请日：2020-11-26

    Applicant: TRINAMIX GMBH

    Inventor： Patrick Schindler ,  Benjamin Rein ,  Christian Bonsignore ,  Michael Eberspach ,  Peter Schillen

    IPC: G06T7/521 ,  G01B11/22 ,  G01B11/25 ,  G06V10/60

    Abstract: Disclosed herein is a display device including an illumination source for projecting an illumination pattern including a plurality of illumination features on a scene; an optical sensor for determining a first image including a plurality of reflection features; a translucent display, where the illumination source and the optical sensor are placed in a direction of propagation of the illumination pattern in front of the display; and an evaluation device configured for evaluating the first image by identifying and sorting the reflection features with respect to brightness, each reflection feature including a beam profile, determining a longitudinal coordinate for each reflection feature by analyzing their beam profiles, unambiguously matching reflection features with corresponding illumination features using the longitudinal coordinate classifying a reflection feature as a real feature or a false feature, rejecting the false features, and generating a depth map for the real features using the longitudinal coordinate.

    Range finder for determining at least one geometric information
    3.
    发明授权
    Range finder for determining at least one geometric information 有权

    公开(公告)号：US11448762B2

    公开(公告)日：2022-09-20

    申请号：US16638946

    申请日：2018-08-28

    Applicant: trinamiX GmbH

    Inventor： Patrick Schindler ,  Peter Schillen ,  Michael Eberspach ,  Christian Lennartz ,  Robert Send ,  Ingmar Bruder

    IPC: G01S17/46 ,  G01S7/481 ,  G01S17/89

    Abstract: A range finder for determining at least one geometric information about at least one object is proposed that includes at least one illumination source adapted to generate at least one illumination pattern, wherein the illumination source is adapted to illuminate the object with the illumination pattern under an angle of inclination; at least one optical sensor having at least one light sensitive area, wherein the optical sensor is designed to generate at least one image matrix in response to an illumination of its light sensitive area by at least one reflection pattern originating from the object; at least one evaluation device being configured for determining the geometric information about the object from the reflection pattern by evaluating the image matrix assuming at least one geometrical constellation to be present in the reflection pattern.

    DETECTOR FOR DETERMINING A POSITION OF AT LEAST ONE OBJECT
    4.
    发明申请
    DETECTOR FOR DETERMINING A POSITION OF AT LEAST ONE OBJECT 有权

    公开(公告)号：US20220101551A1

    公开(公告)日：2022-03-31

    申请号：US17421544

    申请日：2020-01-08

    Applicant: trinamiX GmbH

    Inventor： Michael Eberspach ,  Christian Lennartz ,  Robert Send ,  Patrick Schindler ,  Peter Schillen ,  Ingmar Bruder

    IPC: G06T7/70 ,  G06T5/00 ,  G06T5/50 ,  G06V10/60 ,  G06V10/25 ,  G06V10/14

    Abstract: Described herein is a detector for determining a position of at least one object. The detector includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the sensor element is configured to determine a reflection image of the object. The detector also includes an evaluation device configured to select a reflection feature of the reflection image, and determine a distance estimate of the selected reflection feature of the reflection image by optimizing at least one blurring function fa, wherein the distance estimate is given by a longitudinal coordinate z and an error interval ±ε. The evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the distance estimate, and to match the selected reflection feature with at least one reference feature within the displacement region.

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