Invention Grant
US07659737B1 Electrical, high temperature test probe with conductive driven guard
有权
电气,高温测试探头,带导电驱动防护罩
- Patent Title: Electrical, high temperature test probe with conductive driven guard
- Patent Title (中): 电气,高温测试探头,带导电驱动防护罩
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Application No.: US11836507Application Date: 2007-08-09
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Publication No.: US07659737B1Publication Date: 2010-02-09
- Inventor: Bryan J. Root , William A. Funk
- Applicant: Bryan J. Root , William A. Funk
- Applicant Address: US MN Apple Valley
- Assignee: Celadon Systems, Inc.
- Current Assignee: Celadon Systems, Inc.
- Current Assignee Address: US MN Apple Valley
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A probe needle apparatus and method provides a drive guard having the same potential as a probe needle for reducing signal noise in low current measurements. The probe needle apparatus includes a central conductive core covered with alternating layers of dielectric and conductive materials, a first layer of dielectric material applied to maintain electrical access to the conductive central core while providing continuous isolation of the conductive central core elsewhere, and a conductive drive guard layer applied around the first layer of dielectric material in electrical isolation from the conductive central core.
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