Invention Grant
US07659737B1 Electrical, high temperature test probe with conductive driven guard 有权
电气,高温测试探头,带导电驱动防护罩

Electrical, high temperature test probe with conductive driven guard
Abstract:
A probe needle apparatus and method provides a drive guard having the same potential as a probe needle for reducing signal noise in low current measurements. The probe needle apparatus includes a central conductive core covered with alternating layers of dielectric and conductive materials, a first layer of dielectric material applied to maintain electrical access to the conductive central core while providing continuous isolation of the conductive central core elsewhere, and a conductive drive guard layer applied around the first layer of dielectric material in electrical isolation from the conductive central core.
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