Invention Grant
US07671469B2 SiGe device with SiGe-embedded dummy pattern for alleviating micro-loading effect 有权
SiGe器件采用SiGe嵌入式虚拟图案,可减轻微负载效应

SiGe device with SiGe-embedded dummy pattern for alleviating micro-loading effect
Abstract:
A semiconductor device with dummy patterns for alleviating micro-loading effect includes a semiconductor substrate having thereon a middle annular region between an inner region and an outer region; a SiGe device on the semiconductor substrate within the inner region; and a plurality of dummy patterns provided on the semiconductor substrate within the middle annular region. At least one of the dummy patterns contains SiGe.
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