Invention Grant
- Patent Title: Charged particle filter
- Patent Title (中): 带电粒子滤波器
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Application No.: US12685953Application Date: 2010-01-12
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Publication No.: US08049182B2Publication Date: 2011-11-01
- Inventor: Angus Bewick
- Applicant: Angus Bewick
- Applicant Address: GB London
- Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee Address: GB London
- Agency: Blank Rome LLP
- Main IPC: H01J37/147
- IPC: H01J37/147 ; H01J37/26

Abstract:
A charged particle filter comprises a magnetic deflector and an outer shield. The magnetic deflector has a bore along an axis thereof passing through the deflector from a specimen end to a detector end of the deflector and through which charged particles pass when in use. The deflector is formed from one or more magnets positioned around the bore in a Halbach configuration thereby generating a relatively high magnetic field strength within the bore and a relatively low magnetic field strength outside of the deflector. The deflector has a geometry defining an outer surface and an inner surface, wherein each of the outer and inner surfaces of the deflector taper towards the axis as a respective function of distance in the specimen direction along the axis. The outer shield is formed from a soft magnetic material surrounding the magnet deflector on an outer surface side of the deflector and having a projecting portion which extends in the specimen direction with respect to the magnetic deflector from the specimen end of the deflector.
Public/Granted literature
- US20110168887A1 CHARGED PARTICLE FILTER Public/Granted day:2011-07-14
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