公开(公告)号：US20120273679A1

公开(公告)日：2012-11-01

申请号：US13511941

申请日：2009-12-07

Applicant: Angus Bewick ,  Santokh Singh Bhadare

Inventor： Angus Bewick ,  Santokh Singh Bhadare

IPC: H01J37/285

CPC classification number: H01J37/244 ,  H01J37/26 ,  H01J2237/0203 ,  H01J2237/024 ,  H01J2237/2442 ,  H01J2237/2445 ,  H01J2237/25

Abstract: An x-ray analyser for a transmission electron microscope is described. The analyser has a silicon drift detector moveable in use between an analysis position and a retracted position. The analyser has a housing having an end portion within which the silicon drift detector is retained. The end portion is formed from a material with a relative magnetic permeability of less than 1.004. The analyser also has an automatic retraction system adapted to move the silicon drift detector from the analysis position to the retracted position upon receipt of a trigger signal indicative of a condition in which the power level received by the silicon drift detector from impinging x-rays or electrons is above a predetermined threshold.

Abstract translation: 描述透射电子显微镜的X射线分析仪。 分析仪具有可在分析位置和缩回位置之间使用的硅漂移检测器。 分析仪具有壳体，其具有保持硅漂移检测器的端部部分。 端部由相对磁导率小于1.004的材料形成。 分析仪还具有自动缩回系统，其适于在接收到指示由硅漂移检测器接收的功率电平撞击X射线的条件的触发信号时将硅漂移检测器从分析位置移动到缩回位置，或 电子高于预定阈值。

公开(公告)号：US06885445B2

公开(公告)日：2005-04-26

申请号：US10211558

申请日：2002-08-05

Applicant: Robert Bennett ,  Andrew Mark Woolfrey ,  John Charles Clifford Day ,  Angus Bewick

Inventor： Robert Bennett ,  Andrew Mark Woolfrey ,  John Charles Clifford Day ,  Angus Bewick

IPC: G01J3/02 ,  G01J3/44 ,  G01Q20/02 ,  G01Q60/00 ,  H01J37/22 ,  H01J37/256 ,  G01J3/28 ,  H01J37/30

CPC classification number: H01J37/228 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0243 ,  G01J3/44 ,  H01J37/256 ,  H01J2237/2445 ,  H01J2237/2808

Abstract: An electron microscope 10 is adapted to enable spectroscopic analysis of a sample 16. A parabolic mirror 18 has a central aperture 20 through which the electron beam can pass. The mirror 18 focuses laser illumination from a transverse optical path 24 onto the sample, and collects Raman and/or other scattered light, passing it back to an optical system 30. The mirror 18 is retractable (within the vacuum of the electron microscope) by a sliding arm assembly 22.

Abstract translation: 电子显微镜10适于使得能够对样品16进行光谱分析。 抛物面反射镜18具有中心孔20，电子束可以穿过中心孔20。 反射镜18将来自横向光路24的激光照明聚焦到样品上，并收集拉曼和/或其他散射光，将其返回到光学系统30。 镜子18可以通过滑动臂组件22缩回（在电子显微镜的真空中）。

公开(公告)号：US08049182B2

公开(公告)日：2011-11-01

申请号：US12685953

申请日：2010-01-12

Applicant: Angus Bewick

Inventor： Angus Bewick

IPC: H01J37/147 ,  H01J37/26

CPC classification number: H01J37/09 ,  H01J37/244 ,  H01J37/28 ,  H01J2237/0264 ,  H01J2237/028 ,  H01J2237/24415

Abstract: A charged particle filter comprises a magnetic deflector and an outer shield. The magnetic deflector has a bore along an axis thereof passing through the deflector from a specimen end to a detector end of the deflector and through which charged particles pass when in use. The deflector is formed from one or more magnets positioned around the bore in a Halbach configuration thereby generating a relatively high magnetic field strength within the bore and a relatively low magnetic field strength outside of the deflector. The deflector has a geometry defining an outer surface and an inner surface, wherein each of the outer and inner surfaces of the deflector taper towards the axis as a respective function of distance in the specimen direction along the axis. The outer shield is formed from a soft magnetic material surrounding the magnet deflector on an outer surface side of the deflector and having a projecting portion which extends in the specimen direction with respect to the magnetic deflector from the specimen end of the deflector.

Abstract translation: 带电粒子滤波器包括磁偏转器和外屏蔽件。 磁偏转器具有沿其轴线的孔，其穿过偏转器从试样端到偏转器的检测器端，并且当使用时带电粒子通过该孔。 偏转器由一个或多个以Halbach构型围绕孔定位的磁体形成，从而在孔内产生相当高的磁场强度，并在偏转器外部产生相对低的磁场强度。 偏转器具有限定外表面和内表面的几何形状，其中偏转器的外表面和内表面中的每一个作为沿着轴线的样本方向上的距离的相应函数朝向轴逐渐变细。 外护罩由围绕偏转器外侧表面侧的磁性偏转器的软磁性材料形成，并且具有突出部，该突出部从导流板的试样端部相对于导磁板在试样方向上延伸。