Invention Grant
- Patent Title: In-chamber electron detector
- Patent Title (中): 室内电子检测器
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Application No.: US12141723Application Date: 2008-06-18
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Publication No.: US08164059B2Publication Date: 2012-04-24
- Inventor: Robert Gerlach , Mostafa Maazouz , Trevor Dingle , Mark Utlaut , James McGinn
- Applicant: Robert Gerlach , Mostafa Maazouz , Trevor Dingle , Mark Utlaut , James McGinn
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Griner, LLP
- Agent Michael O. Scheinberg
- Main IPC: H01J37/244
- IPC: H01J37/244 ; H01J37/256 ; H01J37/28

Abstract:
A secondary particle detector 302 for a charged particle beam system 300 includes a scintillator 304 and a transducer 312, such as a photomultiplier tube, positioned within a vacuum chamber 107. Unlike prior art Everhart-Thornley detectors, the photomultiplier is positioned within the vacuum chamber, which improves detection by eliminating optical couplings and provides flexibility in positioning the detector.
Public/Granted literature
- US20080308742A1 IN-CHAMBER ELECTRON DETECTOR Public/Granted day:2008-12-18
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