Invention Grant
- Patent Title: Method of analysis of samples by determination of a function of specific brightness
- Patent Title (中): 通过确定特定亮度的函数来分析样品的方法
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Application No.: US12662826Application Date: 2010-05-05
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Publication No.: US08269965B2Publication Date: 2012-09-18
- Inventor: Peet Kask
- Applicant: Peet Kask
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jacobson Holman PLLC
- Priority: EP96116373 19961012
- Main IPC: G01J3/30
- IPC: G01J3/30 ; G01J3/00 ; G01J1/58 ; G05B21/00

Abstract:
A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function or the number of photon counts.
Public/Granted literature
- US20100230612A1 Method of analysis of samples by determination of a function of specific brightness Public/Granted day:2010-09-16
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