Invention Grant
US08772713B1 Flight time based mass microscope system for ultra high-speed multi mode mass analysis
有权
用于超高速多模质量分析的飞行时间质量显微镜系统
- Patent Title: Flight time based mass microscope system for ultra high-speed multi mode mass analysis
- Patent Title (中): 用于超高速多模质量分析的飞行时间质量显微镜系统
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Application No.: US14117116Application Date: 2012-05-03
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Publication No.: US08772713B1Publication Date: 2014-07-08
- Inventor: Jeong Hee Moon , Dae Won Moon , Tae Geol Lee , Sohee Yoon , Ju Hwang Kim
- Applicant: Jeong Hee Moon , Dae Won Moon , Tae Geol Lee , Sohee Yoon , Ju Hwang Kim
- Applicant Address: KR
- Assignee: Korea Research Institute of Standards and Science
- Current Assignee: Korea Research Institute of Standards and Science
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2011-0045281 20110513
- International Application: PCT/KR2012/003463 WO 20120503
- International Announcement: WO2012/157867 WO 20121122
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J37/26 ; H01J37/28 ; B01D59/44 ; H01J49/00
Abstract:
The present invention aims to provide a time-of-flight based mass microscope system for an ultra-high speed multi-mode mass analysis, for using a laser beam or an ion beam simultaneously to enable both a low molecular weight analysis such as for drugs/metabolome/lipids/peptides and a high molecular weight analysis such as for genes/proteins, without being limited by the molecular weight of the object being analyzed, and for significantly increasing the measuring speed by using a microscope method instead of a microprobe method.
Public/Granted literature
- US20140183354A1 FLIGHT TIME BASED MASS MICROSCOPE SYSTEM FOR ULTRA HIGH-SPEED MULTI MODE MASS ANALYSIS Public/Granted day:2014-07-03
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