Invention Grant
- Patent Title: Method of operating tandem ion traps
- Patent Title (中): 操作串联离子阱的方法
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Application No.: US13340176Application Date: 2011-12-29
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Publication No.: US08822916B2Publication Date: 2014-09-02
- Inventor: Mircea Guna
- Applicant: Mircea Guna
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J49/00 ; H01J49/42 ; H01J49/06

Abstract:
A method for operating tandem ion traps is provided, involving a) accumulating ions in the first ion trap at a first time; b) transmitting a first plurality of ions out of the first ion trap and into the second ion trap at a second time, the first plurality of ions having masses within a first mass range; c) retaining a second plurality of ions in the first ion trap at the second time, the second plurality of ions having masses within a second mass range different from the first mass range; d) transmitting the first plurality of ions out of the second ion trap at a third time; and, e) transmitting the second plurality of ions out of the first ion trap and into the second ion trap at the third time.
Public/Granted literature
- US20120091334A1 METHOD OF OPERATING TANDEM ION TRAPS Public/Granted day:2012-04-19
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