Invention Grant
- Patent Title: Mass spectrometer and mass spectrometry method
- Patent Title (中): 质谱仪和质谱法
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Application No.: US13885435Application Date: 2011-11-17
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Publication No.: US08829434B2Publication Date: 2014-09-09
- Inventor: Hiroyuki Yasuda , Shinji Yoshioka
- Applicant: Hiroyuki Yasuda , Shinji Yoshioka
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2010-259230 20101119
- International Application: PCT/JP2011/076559 WO 20111117
- International Announcement: WO2012/067195 WO 20120524
- Main IPC: H01J49/14
- IPC: H01J49/14 ; H01J49/00 ; H01J49/42 ; H01J49/06

Abstract:
A mass spectrometer is provided including: a collision chamber of generating fragment ions by superimposingly applying an AC voltage and a first DC voltage between linear multipolar electrodes, and accelerating the fragment ions by applying a second DC voltage between a front stage electrode and a later stage electrode; a mass spectrometer unit of carrying out mass separation of the fragment ions; and a control unit of determining the second DC voltage based on the mass-to-charge ratios such that the rates of the fragment ions in the collision chamber become equal regardless of the mass-to-charge ratios. Herein, the control unit increases the second DC voltage as the mass-to-charge ratios selected by the mass spectrometer unit become larger. This allows the mass window to be wider even when a DC electric field is generated in order to solve a crosstalk drawback, in the movement direction of the molecular ions.
Public/Granted literature
- US20130228682A1 MASS SPECTROMETER AND MASS SPECTROMETRY METHOD Public/Granted day:2013-09-05
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