Invention Grant
- Patent Title: Method of avoiding space charge saturation effects in an ion trap
- Patent Title (中): 避免离子阱中空间电荷饱和效应的方法
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Application No.: US13722301Application Date: 2012-12-20
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Publication No.: US08835836B2Publication Date: 2014-09-16
- Inventor: Martin Raymond Green , Jason Lee Wildgoose
- Applicant: Micromass UK Limited
- Applicant Address: GB Wilmslow
- Assignee: Micromass UK Limited
- Current Assignee: Micromass UK Limited
- Current Assignee Address: GB Wilmslow
- Agency: Diederiks & Whitelaw, PLC
- Priority: GB0810599.1 20080610
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J49/42 ; B01D59/44 ; H01J49/02 ; H01J49/00
Abstract:
A mass spectrometer includes a first ion trap arranged upstream of an analytical second ion trap. The charge capacity of the first ion trap is set at a value such that if all the ions stored within the first ion trap up to the charge capacity limit of the first ion trap are then transferred to the second ion trap, then the analytical performance of the second ion trap is not substantially degraded due to space charge effects.
Public/Granted literature
- US20130112865A1 Method of Avoiding Space Charge Saturation Effects In An Ion Trap Public/Granted day:2013-05-09
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