Invention Grant
- Patent Title: Analysis apparatus and analysis method
- Patent Title (中): 分析仪器及分析方法
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Application No.: US13839560Application Date: 2013-03-15
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Publication No.: US08879061B2Publication Date: 2014-11-04
- Inventor: Yuji Ikeda , Ryoji Turuoka
- Applicant: Imagineering, Inc.
- Applicant Address: JP Kobe-shi
- Assignee: Imagineering, Inc.
- Current Assignee: Imagineering, Inc.
- Current Assignee Address: JP Kobe-shi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2010-207383 20100915
- Main IPC: G01J3/30
- IPC: G01J3/30 ; G01J3/02 ; G01N21/68 ; G01N21/71 ; G01J3/443

Abstract:
The analysis apparatus 10 includes a plasma generation device 11 and an optical analysis device 13. The plasma generation device 11 generates initial plasma by energizing a substance in space to be turned into a plasma state, and maintains the plasma state by irradiating the initial plasma with electromagnetic wave for a predetermined period of time. Then, the optical analysis device 13 analyzes the target substance 15 based on a time integral value of intensity of emission from the target substance 15 in an electromagnetic wave plasma region, which is maintained by the electromagnetic wave.
Public/Granted literature
- US20130208275A1 ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2013-08-15
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