Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US14355935Application Date: 2011-11-04
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Publication No.: US08927927B2Publication Date: 2015-01-06
- Inventor: Natsuyo Asano
- Applicant: Natsuyo Asano
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2011/075446 WO 20111104
- International Announcement: WO2013/065173 WO 20130510
- Main IPC: H01J49/02
- IPC: H01J49/02 ; H01J49/26 ; H01J49/00 ; H01J49/42 ; G01N30/72

Abstract:
After a first injection of a sample, amount of change between a highest intensity and each of two ion intensities before and after a voltage showing the highest intensity is calculated for each CE voltage. If the change is equal to or less than a threshold the CE voltage showing the highest intensity in the coarse control mode is selected as the optimal value, without performing a measurement in a fine control mode. If the change in the ion intensity exceeds the threshold, a narrower CE-voltage range and a smaller step size are determined from the measurement result obtained for the first injection of the sample, and after a second injection of the sample, the ion intensity is measured while the CE voltage is varied in the fine control mode.
Public/Granted literature
- US20140326875A1 MASS SPECTROMETER Public/Granted day:2014-11-06
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