Invention Grant
US08946057B2 Laser and plasma etch wafer dicing using UV-curable adhesive film
有权
激光和等离子体蚀刻晶圆切割使用紫外光固化粘合膜
- Patent Title: Laser and plasma etch wafer dicing using UV-curable adhesive film
- Patent Title (中): 激光和等离子体蚀刻晶圆切割使用紫外光固化粘合膜
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Application No.: US13847964Application Date: 2013-03-20
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Publication No.: US08946057B2Publication Date: 2015-02-03
- Inventor: Wei-Sheng Lei , Mohammad K. Chowdhury , Todd Egan , Brad Eaton , Madhava Rao Yalamanchili , Ajay Kumar
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely Sokoloff Taylor Zafman LLP
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/78 ; H01L21/67

Abstract:
Laser and plasma etch wafer dicing using UV-curable adhesive films is described. In an example, a method includes forming a mask above the semiconductor wafer. The semiconductor wafer is coupled to a carrier substrate by a UV-curable adhesive film. The mask covers and protects the integrated circuits. The mask is patterned with a laser scribing process to provide a patterned mask with gaps. The patterning exposes regions of the semiconductor wafer between the integrated circuits. The semiconductor wafer is then etched through the gaps in the patterned mask to form singulated integrated circuits. The UV-curable adhesive film is then irradiated with ultra-violet (UV) light. The singulated integrated circuits are then detached from the carrier substrate.
Public/Granted literature
- US20130280890A1 LASER AND PLASMA ETCH WAFER DICING USING UV-CURABLE ADHESIVE FILM Public/Granted day:2013-10-24
Information query
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