Invention Grant
- Patent Title: Micro-machined imaging interferometer having a static interferometric cavity
- Patent Title (中): 具有静态干涉腔的微加工成像干涉仪
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Application No.: US13578379Application Date: 2011-02-07
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Publication No.: US08964187B2Publication Date: 2015-02-24
- Inventor: Manuel Fendler , Gilles Lafargues , Nicolas Guerineau , Sylvain Rommeluere , Florence De La Barriere
- Applicant: Manuel Fendler , Gilles Lafargues , Nicolas Guerineau , Sylvain Rommeluere , Florence De La Barriere
- Applicant Address: FR Paris FR Chatillon
- Assignee: Commissariat a l'energie atomique et aux energies alternatives,Office National d'Etudes et de Recherches Aerospatiales
- Current Assignee: Commissariat a l'energie atomique et aux energies alternatives,Office National d'Etudes et de Recherches Aerospatiales
- Current Assignee Address: FR Paris FR Chatillon
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR1000562 20100211
- International Application: PCT/EP2011/051760 WO 20110207
- International Announcement: WO2011/098429 WO 20110818
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01J3/26 ; G01J3/02 ; G01J3/28 ; G01J3/453

Abstract:
A micro-machined optical measuring device including: a set of photosensitive detector elements situated on a given face of a first support; a second support, assembled to the first support, forming a prism and including a first face through which a visible radiation is intended to penetrate and a second face, forming a non-zero angle θ with the first face and a non-zero angle α with the given face of the first support, the second face being semi-reflective, the first support and the second support being positioned such that an interferometric cavity is made between the second face and the given face, the distance between the given face of the first support and the second face of the second support varying regularly.
Public/Granted literature
- US20120327421A1 MICRO-MACHINED IMAGING INTERFEROMETER Public/Granted day:2012-12-27
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