Invention Grant
- Patent Title: ToF mass analyser with improved resolving power
- Patent Title (中): ToF质量分析仪具有更好的分辨能力
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Application No.: US13655220Application Date: 2012-10-18
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Publication No.: US09136100B2Publication Date: 2015-09-15
- Inventor: Roger Giles , Matthew Clive Gill
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: GB1118270.6 20111021
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/00 ; H01J49/06

Abstract:
A time of flight analyzer that comprises a pulsed ion source; a non-linear ion mirror having a turn-around point; and a detector. The pulsed ion source is configured to produce an ion pulse travelling along an ion flight axis, the ion pulse comprising an ion group consisting of ions of a single m/z value, the ion group having a lateral spread. The non-linear ion mirror is configured to reflect the ion group, at the turn-around point, along the ion flight axis towards the detector, the passage of the ion group through the non-linear ion mirror causing a spatial spread of the ion group. The time of flight mass analyzer has at least one lens positioned between the ion source and the ion mirror, wherein the or each lens is configured to reduce said lateral spread so as to provide a local minimum of lateral spread within the ion mirror.
Public/Granted literature
- US20130099111A1 TOF Mass Analyser With Improved Resolving Power Public/Granted day:2013-04-25
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