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US09165753B2 Ionization with femtosecond lasers at elevated pressure 有权
飞秒激光器在高压下电离

Ionization with femtosecond lasers at elevated pressure
Abstract:
The present disclosure generally provides ionization methods and devices for use in mass spectrometry. In some embodiments, the ionization methods and devices employ short laser pulses (e.g., pulses having pulsewidths in a range of about 2 fs to about 1 ps) at a high intensity (e.g., an intensity in a range of about 1 TW/cm2 to about 1000 TW/cm2) to ionize an analyte an ambient pressure greater than about 10−5 Torr (e.g., an ambient pressure in a range of about 1 atmosphere to about 100 atmospheres).
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