Invention Grant
- Patent Title: Analyzing light by mode interference
- Patent Title (中): 通过模式干扰分析光
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Application No.: US14373417Application Date: 2012-04-25
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Publication No.: US09176279B2Publication Date: 2015-11-03
- Inventor: Charles M. Santori , Di Liang , Marco Fiorentino , David A. Fattal , Zhen Peng , Raymond G. Beausoleil , Andrei Faraon
- Applicant: Charles M. Santori , Di Liang , Marco Fiorentino , David A. Fattal , Zhen Peng , Raymond G. Beausoleil , Andrei Faraon
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Brooks, Cameron & Huebsch, PLLC
- International Application: PCT/US2012/034865 WO 20120425
- International Announcement: WO2013/162528 WO 20131031
- Main IPC: G02B6/00
- IPC: G02B6/00 ; G02B6/26 ; G02B6/42 ; G02B6/34 ; G01J3/40 ; G01J3/28 ; G01J3/45 ; G02B6/28 ; G01J3/18 ; G02F1/21 ; G02B6/12 ; G01J3/02 ; G01J3/44
Abstract:
Apparatuses and systems for analyzing light by mode interference are provided. An example of an apparatus for analyzing light by mode interference includes a number of waveguides to support in a multimode region two modes of the light of a particular polarization and a plurality of scattering objects offset from a center of at least one of the number of waveguides.
Public/Granted literature
- US20140362374A1 ANALYZING LIGHT BY MODE INTERFERENCE Public/Granted day:2014-12-11
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