Invention Grant
- Patent Title: Method and apparatus for improved sensitivity in a mass spectrometer
- Patent Title (中): 在质谱仪中提高灵敏度的方法和装置
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Application No.: US14368703Application Date: 2012-11-28
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Publication No.: US09177771B2Publication Date: 2015-11-03
- Inventor: Takashi Baba
- Applicant: DH Technologies Development Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd
- Current Assignee: DH Technologies Development Pte. Ltd
- Current Assignee Address: SG Singapore
- International Application: PCT/IB2012/002529 WO 20121128
- International Announcement: WO2013/098602 WO 20130704
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/06 ; H01J49/36

Abstract:
A method and apparatus is provided including an ion source for generating ions, a vacuum chamber having an inlet aperture for receiving ions and an exit aperture for passing ions from the vacuum chamber. At least one ion guide is provided between the inlet and exit apertures, the at least one ion guide having an entrance end and an exit end. The at least one ion guide having an inner cylinder and an outer cylinder. The inner cylinder having a plurality of sections, each section having a different number of slots and the inner cylinder coaxially disposed within the outer cylinder wherein the inner cylinder is configured to generate more than one multipole field. A power supply is provided for providing an RF voltage between the outer and inner cylinders.
Public/Granted literature
- US20140374588A1 METHOD AND APPARATUS FOR IMPROVED SENSITIVITY IN A MASS SPECTROMETER Public/Granted day:2014-12-25
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