Invention Grant
- Patent Title: Calibration of micro-mirror arrays
- Patent Title (中): 微镜阵列的校准
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Application No.: US13746149Application Date: 2013-01-21
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Publication No.: US09201241B2Publication Date: 2015-12-01
- Inventor: Murali Jayapala , Geert Van Der Plas , Veronique Rochus , Xavier Rottenberg , Simone Severi , Stéphane Donnay
- Applicant: IMEC
- Applicant Address: BE Leuven
- Assignee: IMEC
- Current Assignee: IMEC
- Current Assignee Address: BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: EP12152010 20120120
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G02B27/00 ; G02B1/00 ; H04N1/00 ; G02B6/35 ; G02B26/08

Abstract:
A built-in self-calibration system and method for a micro-mirror array device, for example, operating as a variable focal length lens is described. The calibration method comprises determining a capacitance value for each micro-mirror element in the array device at a number of predetermined reference angles to provide a capacitance-reference angle relationship. From the capacitance values, an interpolation step is carried to determine intermediate tilt angles for each micro-mirror element in the array. A voltage sweep is applied to the micro-mirror array and capacitance values, for each micro-mirror element in the array, are measured. For a capacitance value that matches one of the values in the capacitance-reference angle relationship, the corresponding voltage is linked to the associated tilt angle to provide a voltage-tilt angle characteristic which then stored in a memory for subsequent use.
Public/Granted literature
- US20130187669A1 Calibration of Micro-Mirror Arrays Public/Granted day:2013-07-25
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