Invention Grant
US09275825B2 Sample holder for electron microscopy for low-current, low-noise analysis
有权
用于电子显微镜用于低电流，低噪声分析的样品架
- Patent Title: Sample holder for electron microscopy for low-current, low-noise analysis
- Patent Title (中): 用于电子显微镜用于低电流，低噪声分析的样品架
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Application No.: US14369537Application Date: 2012-12-28
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Publication No.: US09275825B2Publication Date: 2016-03-01
- Inventor: John Damiano , David P. Nackashi , Daniel S. Gardiner
- Applicant: John Damiano , David P. Nackashi , Daniel S. Gardiner
- Applicant Address: US NC Morrisville
- Assignee: PROTOCHIPS, INC.
- Current Assignee: PROTOCHIPS, INC.
- Current Assignee Address: US NC Morrisville
- Agency: Moore & Van Allen, PLLC
- Agent Tristan A. Fuierer
- International Application: PCT/US2012/072050 WO 20121228
- International Announcement: WO2013/102064 WO 20130704
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/20 ; H01J37/28 ; H01J37/26
Abstract:
A novel specimen holder for insertion in electron microscopes, wherein the novel specimen holder is designed to minimize electrical noise so that signal integrity can be maintained during in situ electron microscopy.
Public/Granted literature
- US20140361194A1 SAMPLE HOLDER FOR ELECTRON MICROSCOPY FOR LOW-CURRENT, LOW-NOISE ANALYSIS Public/Granted day:2014-12-11
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