Invention Grant
- Patent Title: Substrate processing with rapid temperature gradient control
- Patent Title (中): 基板加工快速温度梯度控制
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Application No.: US11778019Application Date: 2007-07-14
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Publication No.: US09275887B2Publication Date: 2016-03-01
- Inventor: Alexander Matyushkin , Dan Katz , John Holland , Theodoros Panagopoulos , Michael D. Willwerth
- Applicant: Alexander Matyushkin , Dan Katz , John Holland , Theodoros Panagopoulos , Michael D. Willwerth
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Janah & Associates, PC
- Agent Ashok K. Janah
- Main IPC: B05C11/00
- IPC: B05C11/00 ; H01L21/683 ; H01L21/67 ; B05C13/00

Abstract:
A substrate processing chamber comprises an electrostatic chuck comprising a ceramic puck having a substrate receiving surface and an opposing backside surface. In one version, the ceramic puck comprises a thickness of less than 7 mm. An electrode is embedded in the ceramic puck to generate an electrostatic force to hold a substrate, and heater coils in the ceramic puck allow independent control of temperatures at different heating zones of the puck. A chiller provides coolant to coolant channels in a base below the ceramic puck. A controller comprises temperature control instruction sets which set the coolant temperature in the chiller in relation prior to ramping up or down of the power levels applied to the heater.
Public/Granted literature
- US20080017104A1 SUBSTRATE PROCESSING WITH RAPID TEMPERATURE GRADIENT CONTROL Public/Granted day:2008-01-24
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