Invention Grant
US09281175B2 First and second order focusing using field free regions in time-of-flight
有权
在飞行时间内使用无地区的一级和二级对焦
- Patent Title: First and second order focusing using field free regions in time-of-flight
- Patent Title (中): 在飞行时间内使用无地区的一级和二级对焦
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Application No.: US14367234Application Date: 2012-12-06
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Publication No.: US09281175B2Publication Date: 2016-03-08
- Inventor: Robert E. Haufler , William Morgan Loyd
- Applicant: DH Technologies Development Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- International Application: PCT/IB2012/002631 WO 20121206
- International Announcement: WO2013/093587 WO 20130627
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/00 ; B01D59/44 ; H01J49/02

Abstract:
In some embodiments, a time of flight mass spectrometer can comprise an input orifice for receiving ions, a first ion accelerator stage for accelerating the ions along a first path, at least one ion reflector for receiving said accelerated ions and redirecting said ions along a second path different than the first path, a detector for detecting at least a portion of the ions redirected by said at least one ion reflector, and at least first and second field free drift regions disposed between said first acceleration stage and said detector, wherein said second field free region is disposed in proximity of the detector. In some embodiments, the lengths of the field free drift regions can be selected so as to provide 1st and 2nd order corrections of the time of flight of the ions with respect to variation in their initial positions.
Public/Granted literature
- US20150014522A1 FIRST AND SECOND ORDER FOCUSING USING FIELD FREE REGIONS IN TIME-OF-FLIGHT Public/Granted day:2015-01-15
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