Invention Grant
- Patent Title: Light reflection mechanism, optical interferometer and spectrometric analyzer
- Patent Title (中): 光反射机构，光学干涉仪和光谱分析仪
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Application No.: US13265436Application Date: 2010-03-30
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Publication No.: US09291444B2Publication Date: 2016-03-22
- Inventor: Shinya Matsuda , Satoru Hirose
- Applicant: Shinya Matsuda , Satoru Hirose
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta Holdings, Inc.
- Current Assignee: Konica Minolta Holdings, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Cozen O'Connor
- Priority: JP2009-105071 20090423
- International Application: PCT/JP2010/055677 WO 20100330
- International Announcement: WO2010/122879 WO 20101028
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01B9/02 ; G01J3/02 ; G01J3/453 ; G01J9/02 ; G01M11/02 ; G02B26/00
Abstract:
Provided is an inexpensive, high performance, compact, and energy saving light reflection mechanism comprising a first moving portion having a reflecting surface on the front surface, a supporting portion which supports the first moving portion, a first beam and a translating beam which couple the first moving portion and the supporting portion in the form of cantilever beam above and below the supporting portion, and a drive portion which moves the first moving portion, wherein a large amplitude can be obtained by small energy when the first moving portion is forced into resonance vibration in the direction perpendicular to the first reflecting surface. Also provided is an optical interferometer and a spectral analyzer.
Public/Granted literature
- US20120038927A1 Light Reflection Mechanism, Optical Interferometer and Spectrometric Analyzer Public/Granted day:2012-02-16
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